Nanometrology Photo

Nanometrology is the recent development emerged from metrology that concerns with quality-assured measurement, i.e. the two concepts – metrological traceability and measurement uncertainty – specifically at the nanoscale (1 nm – 100 nm). Some of the most common techniques used in nanometrology are atomic force microscopy, electron microscopy and X-ray diffraction. 

  • Atomic force microscopy
  • Scanning tunneling microscope
  • Electron microscope
  • Super resolution microscopy
  • Nanotribology

Are you interested in

Mail us at

Program enquiry
Sponsors & Exhibitors
General Queries
More details about

Authorization Policy

Copyright © 2020-2021 Allied Academies, All Rights Reserved.